FIB Service Request After submitting this form, the request will be reviewed to confirm it meets the criteria for acceptance. If your request is approved, an appropriate staff member will respond to you via email to discuss and arrange your FIB service work. All characterization and service work performed at the QNFCF is done on a "best effort" basis. When discussing your work request with a designated QNFCF staff member please consider providing multiple samples or multiple "areas of interest" on your sample in order to maximize the probability of a successful result. Your E-Mail Address (uWaterloo members must use uW email address) Your name Supervisor's name Do you have a QNFCF account? yes no If not, you may wait for your request to be reviewed. Once approved, you will then need to fill out 'New Project Application and Account Authorization' form before the service can be performed. Sample description and materials present text/htmltext/x-web-textile Please describe your sample, including all the materials present. Please note your samples should be no larger than 1 cm x 1 cm in total. Include as much details as possible, for example deposition method (e.g. sputtering, MBE, spin cast) or crystal structure and orientation may be relevant. Sample schematic Provide a schematic of your sample with materials and nominal thicknesses labelled. Describe the FIB work required text/htmltext/x-web-textile Please describe in detail the FIB work requested. Examples include; 1.) Liftout lamella sample for Transmission Electron Microscopy (TEM), 2.) Milling a crossectional trench for Secondary Electron Microscopy (SEM), 3.) Milling/Depositing nano features on surface. Please include details such as target location and/or size, is it a homogeneous sample or a repeated structure (e.g. device array etc.) or single, unique area of interest. References Upload any files which might aid in the review process, such as literature involving a similar process or sample type. References References References Submit
