Characterization Summary of available characterization equipment https://qnfcf.uwaterloo.ca/equipment/main-cleanroom/characterization https://qnfcf.uwaterloo.ca/@@site-logo/QNFCF.svg Characterization Summary of available characterization equipment Title Type Image 4-point probe [CDE-4pp] Folder Bruker Icon/Fastscan AFM [BRUKER-AFM] Folder Electrical Probe Station [EVERBEING-probe] Folder Electrical Probe Station [SUSS-probe] Folder Ellipsometer [WOOLLAM-ellip] Folder JEOL JSM-7200F Scanning Electron Microscope [JEOL-SEM] Folder LatticeAx Cleaving Tool Folder Microscope #1 [OLYMPUS-scope1] Folder Microscope #2 [OLYMPUS-scope2] Folder Reflectometer: Thin Film Mapping [FILMETRICS-F50] Folder Reflectometer: Thin Film Spot Measurement [FILMETRICS-F40] Folder SEM Sample Coater [LEICA-coater] Folder Surface Profiler [BRUKER-profilometer] Folder Surface Profiler [VEECO-profilometer] Folder Wafer Stress Measurement [TOHO-stress] Folder Wafer inspection lamp Folder
