TEM Request (Service or Training) After submitting this form, the request will be reviewed to confirm it meets the criteria for acceptance. If your request is approved, an appropriate staff member will respond to you via email to discuss and arrange your TEM service work. All characterization and service work performed at the QNFCF is done on a "best effort" basis. When discussing your work request with a designated QNFCF staff member please consider providing multiple samples or multiple "areas of interest" on your sample in order to maximize the probability of a successful result. Your E-Mail Address (uWaterloo members must use uW email address) Your name Supervisor's name Do you have a QNFCF account? yes no If not, you may wait for your request to be reviewed. Once approved, you will then need to fill out 'New Project Application and Account Authorization' form before the service can be performed. Request for Training or Service? TrainingService Sample description (materials, number of samples etc...) text/htmltext/x-web-textile Describe your sample, including all the materials present. Include information on the morphology (e.g. nano/microstructure, 2D layers, deposited material or prepared thin film) and the preparation process of the materials themselves if relevant. Sample Schematic Provide a schematic of your sample with materials and nominal thicknesses labeled. Describe TEM sample preparation text/htmltext/x-web-textile Many samples require special preparation for successful TEM analysis. Please describe specific details of the TEM sample preparation. Include the following information; 1.) Sample support (e.g. holy carbon/graphene coated Cu grid, Moly or Cu ring, FIB liftout grid). 2.) If applicable, sample thinning and cleaning procedure (FIB, wedge polishing and milling etc), 3.) Expected sample area size and thickness in nanometers of the electron transparent region. Describe the TEM analysis requested text/htmltext/x-web-textile Please describe the analysis you wish to perform on the sample. Examples of appropriate work include: 1. Sample morphology (sample dimensions, layer thicknesses), 2. Crystal structure analysis (diffraction studies, atomic resolution TEM), 3. Energy dispersive spectroscopy (EDS) Analysis. Sample specific TEM references Supply relevant literature which describes the details of TEM studies of the same material or similar materials. This will greatly aid in the review process. Sample specific TEM references Sample specific TEM references Sample specific TEM references Describe any experience with TEM you may have. text/htmltext/x-web-textile If you have operated a TEM in the past or attended a TEM session with an operator in the past, please describe here. Include details such as the make model and frequency of use. Submit
