General Info
Vendor: JEOL
Model: JEM-F200 S/TEM with EELS
Purpose: Field emission transmission electron microscope for material analysis
Model: JEM-F200 S/TEM with EELS
Purpose: Field emission transmission electron microscope for material analysis
Important
- Material restrictions in effect: click here
- Training required prior to use: click here
- More info for lab members: Manuals and Processes
Specifications
TEM Imaging
Emitter |
non-CS corrected, cold field emission (CFEG) |
Minimum energy resolution |
0.3 eV or less at 200 kV |
Minimum guaranteed brightness |
8 x 10E8 A/cm2 or higher at 200 kV |
Magnification |
TEM: ×20 to ×2.0 M STEM: ×200 to ×150 M |
Acceleration voltage |
20 kV to 200 kV with presets at 80 kV and 200 kV |
Minimum accelerating voltage step size |
50V |
Analytical Capabilities
- EDS: single 100mm2 SDD detector
- EELS: Gatan GIF Continuum ER (1065) enabling energy-filtered TEM (EFTEM) applications in addition to high-speed EELS. Continuum 1065 is equipped with a low-noise, high dynamic range 2k x 2k CMOS detector with high-speed XCR detector technology. Includes high-speed EDS acquisition upgrade, enabling the simultaneous acquisition of EDS with high-speed EELS data.
Sample Holders
- JEOL Reinforced Single Tilt holder
- JEOL Reinforced Dual-tilt Beryllium holder