General Info

1. Material restrictions in effect: click here
2. Training is required prior to use: click here
3. More info for lab members: Manuals and Processes

In-plane XRD:

By measuring the X-ray signal scattered (i.e. diffracted) from crystal planes at different angles with respect to the sample surface, the characteristic peaks can be used to identify the crystal orientation and texture of the sample.     

In-plane XRR:

By measuring the X-ray signal reflected at shallow angles from the thin film surface, the thickness and roughness of the film can be modeled from the characteristic oscillations in intensity. 

Equipment Specifications:

X-ray Source: Cu with 4 bounce monocromator

Approximate beam size: (1 mm, 6 mm) (x, y)

Maximum sample size: 4 inch diameter

Minimum sample size: 1 cm x 1 cm