Authorized Materials
Summary of material constraints
Lab members wishing to introduce new materials into this system must first obtain authorization from staff. New material requests must be initiated by submitting a Process Review Request form.
Non compliance will result in loss of member privileges
Authorized Substrates & Thin Films
- Silicon wafers (prime, new, virgin of acceptable origin)
- SOI wafers (prime, new, virgin of acceptable origin)
- SiO2 thin film (with known & proven clean history)
Consultation with staff required before processing:
- Some specific metal films including Ti, Au, Ni
- GaAs: Proximity or PECVD capping layer required above 450oC
- InP: Proximity or PECVD capping layer required above 450oC
- InAs: Proximity or PECVD capping layer required above 450oC
- GaN
- HSQ, Medusa 82 and other spin-on-glasses (SOG)
PROHIBITED Substrates & Films
- ZnSe
- Se
- Kapton tape
- Cool grease
- Photo and e-beam resist
- Wax
- Bi2Te3
Important Note on Cleanliness
Any preprocessed wafer exposed to organic material (photoresist, e-beam resist, wax, oil) or other material that can degrade and degas at high temperature must undergo a thorough wet or plasma cleaning before being introduced into this system.
Additional Information
This system is configured to handle 4" diameter wafers with typical thickness of 550um (approx)