General InfoSummary of system capabilitieshttps://qnfcf.uwaterloo.ca/equipment/main-cleanroom/characterization/reflectometer-thin-film-spot-measurement-filmetrics-f40/general-infohttps://qnfcf.uwaterloo.ca/@@site-logo/QNFCF.svg
General Info
Summary of system capabilities
Vendor:Filmetrics Model:F40 Purpose: Tool for mapping transparent thin film thickness