General Info
Summary of system capabilities
Vendor: Creative Design Engineering Inc.
Model: ResMap 178 4-point probe
Purpose: Tool for measuring resistivity of metals and doped semiconductors
Model: ResMap 178 4-point probe
Purpose: Tool for measuring resistivity of metals and doped semiconductors
Important
- Material restrictions in effect: click here
- Training required prior to use: click here
- More info for lab members: Manuals and Processes
Tool Features
- Mapping available for 2" to 8" diameter round wafers.
- Resistance measurement range: 2 mOhm/sq to 5 MOhm/sq
- Wafer handling: Manual load
- Typical measurement time: 1 second per site
- Measurement range: 2 mOhm/sq to 5 MOhm/sq
- Repeatability (1 sigma): <0.02 %
- Accuracy: <0.05 % (using NIST traceable ResCal standards)
- Minimum edge exclusion: 1.5mm
- Data: May be plotted in ResMap tool or exported to Excel or other analysis programs.