General Info

Summary of system capabilities

Vendor:   Bruker
Model:     Dimension FastScan
Purpose:  Scanning probe microscopy tool equipped with FastScan & ICON scanners

Important

  1. Material restrictions in effect: click here
  2. Training required prior to use: click here
  3. More info for lab members: Manuals and Processes

Tool Specifications

Parameter Icon AFM head FastScan AFM head
X-Y scan range 90um x 90um 35um x 35um
Z range   10um  3um
Vertical noise floor  <30pm RMS  <40pm RMS
 X-Y tip velocity max.  - >2mm/sec
 Z tip velocity max. - 12mm/sec
X-Y position noise (closed loop)  <0.15nm RMS <0.2nm RMS
Z sensor noise level 35pm RMS 30pm RMS
Available AFM modes ScanAsyst
TappingMode (air)
Contact Mode
Lateral Force Microscopy
PhaseImaging
Lift Mode
MFM
Force Spectroscopy
Force Volume
EFM
Surface Potential
Piezoresponse Microscopy
Force Spectroscopy
PeakForce QNM
PeakForce TUNA
VITA Thermal Analysis		  ScanAsyst
Nanomechanical Mapping
TappingMode (air)
PhaseImaging
Contact Mode
Lateral Force Microscopy
Lift Mode
MFM
EFM
Force Spectroscopy
Force Volume