Microscopes

Materials Research AFMs

Helping scientists discover, understand and publish in evolving subjects of materials science

High-Resolution Atomic Force Microscopes for Challenging Research

The atomic force microscope (AFM), now entering its fourth decade as a primary technology for advanced materials research, has been used to drive discovery across a nearly countless array of disciplines and applications.

Bruker has led the expansion of atomic force microscope capabilities, starting with the introduction of the first commercial system in the 1980s. Since then, our commitment to helping you do more, and do it more easily, has kept Bruker AFMs at the very cutting-edge of instrumentation innovation. As the technology has matured, our AFMs — powered by exclusive PeakForce Tapping® technology — have consistently delivered highly reliable high-resolution data and empowered scientists to characterize features on ever more complex samples. This data quality and reliability extends to more than just topography; scientists in leading labs around the world are using Bruker AFMs to advance new nanomechanical, nanoelectrical, and nanoelectrochemical research, on the order of three peer-reviewed published articles per day.

Products

Find the Best Atomic Force Microscope for Your Application

Need help? Contact us to discuss your requirements or see our recommendations for instrument selection.

Large-Sample Atomic Force Microscope Systems

^NEWDimension Nexus

Redefining the quintessential value AFM with highest performance in its class

Dimension FastScan

The original large-sample, fast-scanning AFM — speed and productivity with no sacrifice in resolution

Dimension Icon

Proven highest performance and versatility in an easily tunable large-sample AFM platform

Dimension XR

Turnkey large-sample AFM systems that deliver unique, first-and-only modes and capabilities

See how to use upgrades and add-ons to customize a Dimension Icon AFM with extended capabilities.

Small-Sample Atomic Force Microscope Systems

MultiMode 8-HR

The benchmark advanced-research small-sample AFM for highest resolution and extendable versatility

Innova

Best value, small-sample research AFM that offers routine high-resolution imaging and flexibility

Dimension IconIR

The leading-edge photothermal IR spectroscopy platform for advanced nanoscale, sub-micron, and macro scale applications

Innova-IRIS

The first-and-only complete tip-enhanced Raman spectroscopy (TERS) solution

NanoWizard NanoOptics

AFM optimized for seamless integration with optical techniques enables wide range of nanoscale optical imaging applications

NanoWizard V NanoScience

Leading BioAFM addressing materials and life science applications in a single platform

AFM Probes

AFM Expertise Built Into Every Probe

Bruker AFM Probes

Find a wide variety of AFM probes, cantilevers and accessories in our online store. Our AFM expertise is built into every probe!

Free PDF: AFM Probes Selection Guide [2023]

Learn how to decipher probe names, explore application-specific recommendations, and compare probe specifications.

Download Now

The Fundamentals of AFM Probe Selection [2023]

Learn from our experts about the latest innovations in probe design, the best probes available today, and how to select the right probe for your application.

Watch On-Demand Webinar

An atomic force microscope uses a probe to measure tip-sample forces as the tip presses against the sample. The AFM probe is a consumable that consists of a sharp tip on a free-moving cantilever mounted on a chip. One or several cantilevers can be mounted on a comparatively large silicon chip (Figure 1).

The geometry and material of both cantilever and tip can be optimized for a given application, resulting in a large library of probe options.

A single silicon chip containing multiple probes for atomic force microscopy

Figure 1. A single silicon chip containing multiple probes.

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Most AFM probes are made from silicon or silicon nitride. Silicon probes enable stiffer cantilevers and sharper tips, while silicon nitride probes are more durable and flexible. Bruker’s TappingMode probes are generally made from silicon, and contact mode and ScanAsyst probes are generally made from silicon nitride. There is a considerable amount of functionality and flexibility when modifying these common AFM probe materials with coatings or replacing them with individual molecules of interest. The geometry and material of both cantilever and tip can be optimized for a given application, resulting in a large library of probe options on www.BrukerAFMprobes.com.

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The elements of a “good” AFM probe are application-dependent. As such, choosing the right AFM probe relies on balancing parameters of interest including stiffness, spring constant, resonant frequency, and quality factor while considering the needs of your application and the AFM mode used.

Watch our 2023 webinar "The Fundamentals of AFM Probe Selection" to learn about the functional and experimental considerations for selecting a probe, or our 2024 AFM Probes Webinar to hear our AFM experts' recommendations for probe selection.

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Bruker is the only major AFM equipment manufacturer that also owns and operates a probes nanofabrication facility, and our broad experience enables us to design and fabricate a wide range of probe types to directly address the evolving needs of AFM users. For more information and to place an order, visit www.BrukerAFMprobes.com.

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Visit our AFM probes online store

AFM Modes

Expand Your Research with World's Best Selection of AFM Modes

With an unrivalled — and still growing — suite of available imaging modes, Bruker has an AFM technique for every investigation.

Bruker AFM modes allow researchers to probe their samples’ electrical, magnetic, or materials properties at the nanoscale with unmatched confidence. Bruker’s proprietary PeakForce Tapping technology represents a new core imaging paradigm that provides unprescedented high-resolution imaging, extends AFM measurements into a range of samples not previously accessed, and uniquely enables simultaneous nanoscale property mapping.

This and our other AFM mode advances — such as DataCube, Ringing, ss-PFM, and our new Torsional Resonance Dynamic Friction Microscopy (TR-DFM) and PeakForce Magnetic Force Microscopy modes — are enhancing other correlative and quantitative mapping techniques to enable the development of new modes and deliver new possibilities in an ever-expanding set of topograhical, mechanical, electrical, and chemical applications.

See All AFM Modes

AFM Modes

AFM modes and the broad capabilities from AFM beyond imaging

AFM FAQs

Frequently Asked Questions

An atomic force microscopy (AFM) is a type of scanning probe microscope (SPM). It uses a very sharp probe that is raster-scanned to produce a true 3D topographical map of the surface of a sample with nanoscale resolution.

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DOWNLOAD: AFM for Materials E-Book

All types of scanning probe microscopes use a physical probe touching the surface of a sample to scan the surface and collect data. However, their measurement mechanisms are very different — an atomic force microscope uniquely measures the cantilever deflection (bending) caused by forces between the tip and the sample surface. As a result, atomic force microscopes can be used to measure a much wider range of materials than STM.

The basic working principle of an atomic force microscope is:

A sharp tip at the free end of a cantilever is raster-scanned over a small area of sample.
As the tip passes over the surface, variations in height cause the cantilever to bend.
This bending, or change in deflection, is detected through movement of a laser or super luminescent diode (SLD) that is reflected off the cantilever into a position-sensitive photodetector (PSPD).

Throughout this process, piezo actuators operate within an electronic feedback loop to move the tip or sample closer or further away from each other to maintain the relative tip-sample distance and a constant setpoint.

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The following table compares methods commonly used to characterize materials at the nanoscale and can be used to understand:

What is the difference between AFM and SEM?
What is the difference between AFM and STM?
What is the difference between AFM and TEM? and
What is the difference between AFM and confocal microscopy?

Each technique has a great deal of nuance, and values given are approximations. The green marker indicates “definitely yes," the yellow marker indicates “sometimes yes, with additional considerations," and the red marker indicates “definitely no."

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WATCH: New Insights into Nanoscale Surface Properties Through PeakForce Tapping and Ringing Mode

	AFM	STM	SEM	TEM	Confocal
3D Imaging	🟩	🟩	🟨	🟨	🟩
Measurements in Vacuum	🟩	🟩	🟩	🟩	🟥
Measurements in Air	🟩	🟥	🟥	🟥	🟩
Measurements in Liquid	🟩	🟥	🟥	🟥	🟩
Label-Free Experiments	🟩	🟩	🟩	🟩	🟥
Appx. Lateral Resolution (nm)	1	0.1	1-10	0.05-05	200
Appx. Vertical Resolution (nm)	0.1	0.1	N/A	N/A	500
Sample Requirements/Limitations	Very few limitations	Limited to conductive samples	Limited to conductive or coated samples	Limited to sample thickness <100 nm	Samples must be tagged

See More AFM FAQs

AFM Applications

Investigate Properties in Nanoscale Structures

Atomic force microscopes are used in a wide variety of research and industry applications to collect information about the nanoscale structure and properties of almost any type of sample.

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While atomic force microscopy is best known for its ability to resolve surface structure, it provides valuable information about other material properties at the nanoscale. These include mechanical, electrical, electrochemical, piezoelectric, magnetic, thermal, and optical properties. AFM can also be used to manipulate a sample (push, pull, or write) in nanolithography and intra-/inter-molecular (un)binding studies.

With a large variety of measurement types and high degree of sample flexibility, AFM has become a fundamental nano-characterization technique in both academic research and industry for a range of applications, including:

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There are very few limitations on what kinds of samples can be analyzed using AFM. AFM has been used to probe the surfaces of crystalline and non-crystalline materials, microelectronic devices, live cells, dental materials, and so much more. For each sample type, sample preparation, experimental design, and probe choice should be considered carefully.

See the documents below for select examples of AFM used for a variety of materials:

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Graphene and 2D Materials

Advanced graphene and 2D materials property measurements

Battery Materials

Highest resolution materials characterization for advanced battery research

Polymers

Nanoscale imaging of polymers structure and morphology

Closed-loop, syndiotactic polpropylene in TappingMode, 5μm. Read More

Investigation of crystallization kinetics of syndiotactic polypropylene. Original polymer was subjected to quick heating from room temperature (left) to a completely melting state at 160°C. High-temperature isothermal crystallization at 128°C promoted an equilibrium of conditions and the formation of bigger than original lamellae crystals. Right image shows partial crystallization at 101min.

Demonstrating highest resolution on a delicate molecular layer, the TappingMode images here reveal the molecular structure of methanol self-assembly on HOPG. Three images show 0.5nm step and herringbone pattern with spacing 5nm, as well as 0.5nm molecular spacing (small image scale bar 3nm). Length scale of rows suggest ordered methanol molecules tilted at different angles. Vertical scale on the 250nm scan is 1nm. Images acquired by Bede Pittenger, Ph.D.

This PeakForce Tapping image of aluminosilicate glass demonstrates highest resolution on an industrial sample in air. Maintaining tip sharpness is key. The blind tip reconstruction from subsequent scan shows tip end radius of about 1nm, indicating negligible tip wear on this challenging sample. Full image scan size 5um, 5000x5000 pixels. PeakForce Setpoint 600pN, FastScan B probe. Images acquired by Shuiqing Hu, Ph.D.

This current map produced in TUNA mode on HOPG demonstrates “lattice resolution” with spacing of 0.25nm. Traditionally, STM has been needed to achieve this sort of resolution in a current map. PeakForce TUNA application module, PF-TUNA probe, 60pA current range. 0.5nm scale bar on high-resolution image. Image acquired by Hartmut Stadler, Ph.D.

Dimension FastScan AFM - Loss Modulus of PS Matrix and PMMA

3D surface representing sample topography with false coloring by loss modulus. Blue areas have higher loss modulus and the red areas are lower loss modulus corresponding to the PS matrix and PMMA inclusions respectively. Loss modulus map generated by contact resonance via Bruker’s FASTForce Volume Nanomechanics mode. 5µm scan, ~ 590kHz, 256x256 pixels.

Dimension FastScan AFM - PeakForce QNM Modulus Images of Graphene on Hexagonal Boron Nitride

PeakForce QNM modulus images of graphene on hexagonal boron nitride, revealing a transition to a commensurate lattice upon alignment with highly localized strain relief. See also Nature Physics 10, 451–456 (2014).

Dimension FastScan AFM - Syndiotactic Polypropylene

Syndiotactic polypropylene domains (violet) surrounded by a PMMA (teal) matrix. Topographic data painted with modulus to allow easy identification of components, revealing lamellae formed by syndiotactic polypropylene that propagate through the PMMA matrix. Image size 8 µm.

MultiMode 8-HR AFM - PeakForce TUNA Current Map of Poly(3-hexylthiophene) Organic Conductive Nanowires

PeakForce TUNA current map of poly(3-hexylthiophene) (P3HT) organic conductive nanowires using 3V bias. Image shows a 3 μm scan area where the current varies from 0 to 80 pA.

MultiMode 8-HR AFM - Modulus Image Between Tie and Sealant Layers

This modulus image shows the subtle transition between the ULDPE tie layer to the PS/LDPE sealant layer of cross sectioned packaging material. Mapping the modulus at high spatial resolution reveals lamella from the tie layer act as nucleation sites penetrating into the sealant and increasing lamellar ordering within 1 μm from the interface. Image size 3 μm.

Closed-loop topography map of a kerf test structure showing contact holes inside dual-damascene trenches. The combination of the Dimension scanner and a Bruker FIB probe enabled mapping of this challenging geometry without damage to the probe tip.

Innova AFM - Origami-DNA on Mica Imaged in Liquid

Individual triangular self-assemblies of origami-DNA on mica imaged in liquid reveal individual strands and fine structure at the connection points. 250 nm closed-loop image. Sample courtesy of P. Rothemund, Caltech.

Scanning capacitance data of a silicon DRAM cell. The 2D dopant profile provided by dC/dV measurements allows the visualization of device defects and the extraction of critical parameters, such as gate lengths. This image was acquired in SCM/Dark Lift mode, ensuring accurate and artifact-free dopant mapping. 25 μm closed-loop image.

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Resources

Learn More About Atomic Force Microscopy

Bruker has deep experience and expertise in all things related to atomic force microscopy.

We are eager to share this knowledge with the larger research community. Be sure to explore our extensive offering of resources, below.

If you would like to speak with a Bruker atomic force microscopy expert in person, contact us to discuss your specific application requirements and measurement needs.

Watch Our AFM Webinars

Our webinars cover best practices, introduce new products, provide quick solutions to tricky questions, and offer ideas for new applications, modes, or techniques.

Browse the full library here

March 20, 2025

Dimension Nexus AFM: The Intersection of High Performance and Unbeatable Value

Learn about the unique features and capabilities that are central to the best‑in‑class performance of this cost‑effective AFM.

On-Demand Session • 1 Hour 15 Minutes

Nanoelectrical Characterization Using Atomic Force Microscopy

Learn about the advantages of AFM for nanoelectrical property characterization and practical considerations for using AFM based on your sample and measurement requirements.

On-Demand Session • 57 Minutes

Reverse Tip Sample (RTS) Scanning Probe Microscopy

This webinar shows how changing a fundamental aspect of SPM (the tip-sample configuration) could create new opportunities and boost efficiency.

AFM E-Books

Atomic Force Microscopy for Materials E-Book

AFM for Materials E-Book

Download our in-depth introductory guide to atomic force microscopy and its materials characterization capabilities.

Download E-Book

Battery Research E-Book

Learn more about the main nanoscale analytical techniques used to characterize Li-ion battery materials: nanoindentation and AFM.

Download E-Book

The Latest Advances in AFM Nanoelectrical Modes

This e-book discusses the technology behind DataCube nanoelectrical modes, how they can be applied to perform hyperspectral mapping, and finally details several case studies.

Download E-Book

Browse Our AFM Library

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Results 1 - 10 of 39

Dimension Nexus AFM: The Intersection of High Performance and Unbeatable Value

Learn about the unique features and capabilities that are central to the best‑in‑class performance of this cost‑effective AFM.

Nanoelectrical Characterization Using Atomic Force Microscopy

Learn about the advantages of AFM for nanoelectrical property characterization and practical considerations for using AFM based on your sample and measurement requirements.

Reverse Tip Sample (RTS) Scanning Probe Microscopy

This webinar shows how changing a fundamental aspect of SPM (the tip-sample configuration) could create new opportunities and boost efficiency.

2 3 4 5

Journal Club

AFM for Materials Journal Club

Subscribe to our monthly Journal Club emails to keep apprised of recent research with AFMs.

Learn More

Additional Resources

Atomic Force Microscopy FAQs

Answers to the atomic force microscopy questions we are asked most often.

Free PDF: AFM Probes Selection Guide [2023]

Learn how to decipher probe names, explore application-specific recommendations, and compare probe specifications.

Download Now

PeakForce Tapping Poster

Download your 24x36 print-ready poster.

Download Poster

Leveraging Torsional Resonance AFM to Study Moiré Superlattices in 2D Materials

See how Stanford University researchers recently applied torsional resonance dynamic friction microscopy (TR-DFM) to resolve moirés formed in twisted bilayer graphene and in a layer of graphene atop hexagonal boron nitride (hBN).

Read the Article in Microscopy and Analysis March/April 2024

Advancing In-Plane Property Measurements with Torsional Resonance–Based Modes

Learn how TR-based modes can resolve in-plane anisotropy and measure dynamic friction to enable routine atomic lattice imaging, even for 2D materials, and can be combined with other modes provide unique capabilities.

Read the Article in Microscopy and Analysis March/April 2024

Publications

Browse Atomic Force Microscopy Articles

Article Year	Article Title	Authors	AFM System	Mode	Research Area
2022	Implementation of an Experimental Setup to Qualitatively Detect Hydrogen Permeation Along Grain Boundaries in Nickel Using Scanning Kelvin Probe Force Microscopy Under Varying Atmospheres	Gruenewald, P.; Hautz, N.; Motz, C.	Icon	PeakForce KPFM	Fuel Cell, Nanoelectrical
2019	Nanoscale DMA With the Atomic Force Microscope: A New Method for Measuring Viscoelastic Properties of Nanostructured Polymer Materials	Pittenger, B.; Osechinskiy, S.; (…); Mueller, T.	Icon	AFM-nDMA	Polymers, Nanomechanical
2021	Investigating the Relationship Between the Mechanical Properties of Plasma Polymer-Like Thin Films and Their Glass Transition Temperature	Vinx, N.; Damnan, P.; (…); Thiry, D.	Icon	AFM-nDMA, PeakForce QNM	Polymers, Nanomechanical
2020	Comparison of Fresh and Aged Lithium Iron Phosphate Cathodes Using a Tailored Electrochemical Strain Microscopy Technique	Simolka, M.; Kaess, H.; Friedrich, K. A.	Icon	AFM-nDMA, PeakForce QNM	Batteries, Nanomechanical, Nanoelectrochemical
2020	Nanoscale Viscoelastic Characterization of Asphalt Binders Using the AFM-nDMA Test	Aljarrah, M.; Masad, E.	Icon	AFM-nDMA, PeakForce QNM	Bitumen, Nanomechanical

Showing 1 to 5 of 85 entries

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News & Events

Read the Latest News

March 20, 2025

Dimension Nexus AFM: The Intersection of High Performance and Unbeatable Value

Learn about the unique features and capabilities that are central to the best‑in‑class performance of this cost‑effective AFM.

On-Demand Session • 1 Hour 15 Minutes

Nanoelectrical Characterization Using Atomic Force Microscopy

Learn about the advantages of AFM for nanoelectrical property characterization and practical considerations for using AFM based on your sample and measurement requirements.

On-Demand Session • 57 Minutes

Reverse Tip Sample (RTS) Scanning Probe Microscopy

This webinar shows how changing a fundamental aspect of SPM (the tip-sample configuration) could create new opportunities and boost efficiency.

PeakForce MFM

Highest spatial resolution and sensitivity for nanoscale magnetic characterization

Torsional Resonance Mode

Probe samples dynamically in both vertical and lateral dimensions

Map of Vc+ created by collecting spectra at points in a 10x10 matrix

Switching Spectroscopy Piezoresponse Force Microscopy (SS-PFM)

Quantitative ferroelectric hysteresis loop measurement with highest sensitivity and accuracy

Ringing Mode

A new PeakForce Tapping add-on for compositional mapping

March 20, 2025

Dimension Nexus AFM: The Intersection of High Performance and Unbeatable Value

Learn about the unique features and capabilities that are central to the best‑in‑class performance of this cost‑effective AFM.

On-Demand Session • 1 Hour 15 Minutes

Nanoelectrical Characterization Using Atomic Force Microscopy

Learn about the advantages of AFM for nanoelectrical property characterization and practical considerations for using AFM based on your sample and measurement requirements.

On-Demand Session • 57 Minutes

Reverse Tip Sample (RTS) Scanning Probe Microscopy

This webinar shows how changing a fundamental aspect of SPM (the tip-sample configuration) could create new opportunities and boost efficiency.

Service and Support

How Can We Help?

Bruker partners with our customers to solve real-world application issues. We develop next-generation technologies and help customers select the right system and accessories. This partnership continues through training and extended service, long after the tools are sold.

Our highly trained team of support engineers, application scientists and subject-matter experts are wholly dedicated to maximizing your productivity with system service and upgrades, as well as application support and training.

Find Bruker Support Near You See Our AFM Training Courses

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Materials Research AFMs

High-Resolution Atomic Force Microscopes for Challenging Research

Introduction to Atomic Force Microscopy

AFM for Materials E-Book

How to Choose an AFM

Find the Best Atomic Force Microscope for Your Application

Large-Sample Atomic Force Microscope Systems

NEW Dimension Nexus

Dimension FastScan

Dimension Icon

Dimension XR

Small-Sample Atomic Force Microscope Systems

MultiMode 8-HR

Innova

Specialty AFM Systems

Dimension IconIR

Innova-IRIS

NanoWizard NanoOptics

NanoWizard V NanoScience

AFM Expertise Built Into Every Probe

Bruker AFM Probes

Free PDF: AFM Probes Selection Guide [2023]

The Fundamentals of AFM Probe Selection [2023]

Expand Your Research with World's Best Selection of AFM Modes

AFM Modes

Frequently Asked Questions

Investigate Properties in Nanoscale Structures

Graphene and 2D Materials

Battery Materials

Polymers

Gallery of Applications

Learn More About Atomic Force Microscopy

Watch Our AFM Webinars

Dimension Nexus AFM: The Intersection of High Performance and Unbeatable Value

Nanoelectrical Characterization Using Atomic Force Microscopy

Reverse Tip Sample (RTS) Scanning Probe Microscopy

AFM E-Books

AFM for Materials E-Book

Battery Research E-Book

The Latest Advances in AFM Nanoelectrical Modes

Browse Our AFM Library

Journal Club

AFM for Materials Journal Club

Additional Resources

Atomic Force Microscopy FAQs

Free PDF: AFM Probes Selection Guide [2023]

PeakForce Tapping Poster

Leveraging Torsional Resonance AFM to Study Moiré Superlattices in 2D Materials

Advancing In-Plane Property Measurements with Torsional Resonance–Based Modes

Browse Atomic Force Microscopy Articles

Read the Latest News

Dimension Nexus AFM: The Intersection of High Performance and Unbeatable Value

Nanoelectrical Characterization Using Atomic Force Microscopy

Reverse Tip Sample (RTS) Scanning Probe Microscopy

New AFM Modes

PeakForce MFM

Torsional Resonance Mode

Switching Spectroscopy Piezoresponse Force Microscopy (SS-PFM)

Ringing Mode

Connect with Us at an Upcoming Event

Dimension Nexus AFM: The Intersection of High Performance and Unbeatable Value

Nanoelectrical Characterization Using Atomic Force Microscopy

Reverse Tip Sample (RTS) Scanning Probe Microscopy

How Can We Help?

Contact Us

^NEWDimension Nexus